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Derniers dépôts
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Eugénie Martinez, Pierre-Marie Deleuze, Nicolas Gauthier, Tarek Spelta, Marc Veillerot, et al.. L'HAXPES de laboratoire pour l'étude de multicouches en microélectronique. JNSPE 2024 - Les journées nationales des spectroscopies de photoemission (INSPE), May 2024, Lille, France. , 2024. ⟨cea-04601885⟩
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Giancarlo La Penna, Chiara Mancini, Anacleto Proietti, Luca Buccini, Daniele Passeri, et al.. Strained silicon technology: Non-destructive nanoscale characterization through Tip-enhanced Raman Spectroscopy. Journal of Applied Spectroscopy, 2024, pp.10.1177/00037028241246292. ⟨10.1177/00037028241246292⟩. ⟨cea-04601717⟩
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Tarek Spelta, Marc Veillerot, Eugénie Martinez, Nicolas Chevalier, Denis Mariolle, et al.. Characterization of GaN structures for power electronics by secondary ion mass spectrometry and atomic force microscope approach. Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics, 2023, Secondary Ion Mass Spectrometry (SIMS), 41 (3), pp.034003. ⟨10.1116/6.0002573⟩. ⟨hal-04216907⟩